Structural analysis of RF sputtered Ge-Sb-Se thin films by Raman and X-ray photoelectron spectroscopies - Université de Rennes Access content directly
Journal Articles Journal of Non-Crystalline Solids Year : 2016

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hal-01319062 , version 1 (20-05-2016)

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E. Baudet, C. Cardinaud, A. Girard, E. Rinnert, Karine Michel, et al.. Structural analysis of RF sputtered Ge-Sb-Se thin films by Raman and X-ray photoelectron spectroscopies. Journal of Non-Crystalline Solids, 2016, 444, pp.64--72. ⟨10.1016/j.jnoncrysol.2016.04.017⟩. ⟨hal-01319062⟩
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