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Journal Articles Optics Letters Year : 2018

Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces

Abstract

We investigated deformation of InP that was introduced by thin, narrow, dielectric SINx stripes on the (100) surface of InP substrates. Quantitative optical measurements were performed using two different techniques based on luminescence from the InP first, by degree of polarization of photoluminescence; and second, by cathodoluminescence spectroscopy. The two techniques provide complementary information on deformation of the InP and thus together provide a means to evaluate approaches to simulation of the deformation owing to dielectric stripes. Ultimately, these deformations can be used to estimate changes in refractive index and gain that are a result of the stripes. (C) 2018 Optical Society of America
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Dates and versions

hal-01861356 , version 1 (09-02-2021)

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Jean-Pierre Landesman, Daniel T Cassidy, Marc Fouchier, Christophe Levallois, Erwine Pargon, et al.. Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces. Optics Letters, 2018, 43 (15), pp.3505. ⟨10.1364/OL.43.003505⟩. ⟨hal-01861356⟩
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