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Article Dans Une Revue Ultramicroscopy Année : 1995

Reconstruction of the dielectric contrast profile from near-field data

Résumé

A perturbative model describing the influence of topography and dielectric contrast on the near field scattered by an inhomogeneous surface is derived. It is shown that the near-field intensity is sensitive to the integral of the dielectric constrast in the vertical direction across the sample. A solution to the inverse problem from a measurement of the near-field intensity along a line at a constant height above the surface is reported.

Dates et versions

hal-01618266 , version 1 (17-10-2017)

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Remi Carminati, Jean-Jacques Greffet. Reconstruction of the dielectric contrast profile from near-field data. Ultramicroscopy, 1995, 61 (1-4), pp.11 - 16. ⟨10.1016/0304-3991(95)00138-7⟩. ⟨hal-01618266⟩
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