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Structure: Internal structure identifier : 494820

Characteristics of a-IGZO TFT with SU-8 Gate Insulator as Various Hard-bake Temperature

Mintaek Hong , Moon Seungjae , Jongseok Lee , Tayeb Mohammed-Brahim , Euijung Yun et al.
International Conference on Advanced Electromaterials, ICAE2017, Nov 2017, Jeju, South Korea
Conference papers hal-02483240v1

The Effect of Bake Temperature on SU-8 Gate Insulator of IGZO Thin Film Transistor

Min-Taek Hong , Seung Jae Moon , Jong Mo Lee , Byung Seong Bae , Eui-Jung Yun et al.
Journal of the Korean Physical Society, 2018, 73 (3), pp.297-301. ⟨10.3938/jkps.73.297⟩
Journal articles hal-01879714v1

Development of Digital Circuit using Inkjet Printed N-type Organic Field Effect Transistors

Moon Seungjae , Seongmin Park , Byungseong Bae , Mohammed-Brahim Tayeb , Maxime Harnois et al.
15th International Conference on Thin Film Transistors ITC 2019, Feb 2019, Naha, Japan
Conference papers hal-02483285v1

The Oxide TFT with Solution Based Gate Insulator,

M.T. Hong , S.M. Shin , J.M. Lee , Emmanuel Jacques , Tayeb Mohammed-Brahim et al.
ECS Meeting , 2016, JEJU, South Korea
Conference papers hal-01521641v1