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Functional dielectric oxide and oxynitride compounds in the perovskite La-Ti-O-N system: from thin film sputtering deposition to dielectric characterizationInternational Symposium on Inorganic and Environmental Materials 2013 (ISIEM 2013), Oct 2013, Rennes, France
Conference papers
hal-00869754v1
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Structural and dielectric characterization of perovskite oxide and oxynitride lanthanum titanium films deposited by reactive sputtering deposition19th International Vacuum Congress (IVC-19), Sep 2013, Paris, France
Conference papers
hal-00869768v1
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Reactive Sputtering Deposition of Perovskite Oxide and Oxynitride Lanthanum Titanium Films: Structural and Dielectric CharacterizationCrystal Growth & Design, 2013, pp.4852-4858. ⟨10.1021/cg4010196⟩
Journal articles
hal-00875068v1
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