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authFullName_s : T. Mohammed-Brahim

Silicon: A flexible material for bendable electronics and sensors

Y. Kervran , K. Kandoussi , H. Dong , S. Janfaoui , N. Coulon et al.
31st Symposium on Microelectronics Technology and Devices, SBMicro 2016, Aug 2016, Horizonte, Brazil. ⟨10.1109/SBMicro.2016.7731313⟩
Conference papers hal-01484551v1

State creation induced by gate bias stress in unhydrogenated polysilicon TFTs

B. Tala-Ighil , A. Rahal , K. Mourgues , A. Toutah , L. Pichon et al.
Thin Solid Films, 1999, 337 (1-2), pp.101-104. ⟨10.1016/S0040-6090(98)01192-4⟩
Journal articles istex hal-03776563v1

Comparison of the electrical behavior in the subthreshold region between laser and solid phase crystallized polysilicon thin film transistors

L. Pichon , A. Mercha , R. Carin , T. Mohammed-Brahim , O. Bonnaud et al.
Solid-State Electronics, 2002, 46 (4), pp.459-466. ⟨10.1016/S0038-1101(01)00324-0⟩
Journal articles hal-03776568v1

LTPS-TFT with embedded PbS quantum dots as near-infrared photodetector: Using an hybrid technology to improve the detection performance in an easy process

Xiang Liu , Emmanuel Jacques , L Wei , T. Mohammed-Brahim
International Thin Film Transistors Conference ITC 17, 2017, Austin, United States
Conference papers hal-01529989v1

Characterization of in-situ doped polycrystalline silicon using Schottky diodes and admittance spectroscopy

H. Ayed , L. Béchir , M. Benabdesslem , N. Benslim , L. Mahdjoubi et al.
Journal of Nano and Electronic Physics, 2016, 8, pp.01038
Journal articles hal-01368124v1

Development of inkjet printed N-Type organic field-effect transistor with morphology control of insulating layer

S.J. Moon , M. Robin , K. Wenlin , T. Mohammed-Brahim , E. Jacques et al.
24th International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2017, Jul 2017, Kyoto, Japan
Conference papers hal-01671568v1
Image document

Performance improvement of IF(CN2)2 meta based N-channel OTFTs and their integration into a stable CMOS inverter

S. Bebiche , I. Bouhadda , T. Mohammed-Brahim , N. Coulon , Jean-Francois Bergamini et al.
Solid-State Electronics, 2017, 130, pp.49--56. ⟨10.1016/j.sse.2017.01.009⟩
Journal articles hal-01484527v1

Performance of thin film Transistors on Unhydrogenated In-Situ Doped Polysilicon films Obtained by Solid Phase Crystallization

K. Mourgues , F. Raoult , L. Pichon , T. Mohammed-Brahim , D. Briand et al.
MRS Proceedings, 1997, 471, pp.155. ⟨10.1557/PROC-471-155⟩
Journal articles hal-03662121v1

Behavior of Polysilicon Thin-Film Transistors at Different Temperatures

Jean-François Llibre , H. Toutah , B. Tala-Ighil , B. Boudart , T. Mohammed-Brahim et al.
Solid State Phenomena, 2003, 93, pp.67 - 72. ⟨10.4028/www.scientific.net/SSP.93.67⟩
Journal articles hal-01647854v1

Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors

L. Pichon , A. Mercha , R. Carin , O. Bonnaud , T. Mohammed-Brahim et al.
Applied Physics Letters, 2000, 77 (4), pp.576-578. ⟨10.1063/1.127049⟩
Journal articles hal-03776564v1

Capacitive Sensor Array for Fingerprint Recognition

Y. E. Jeon , Y. J. Lee , M. K. Jang , B. M. Seo , I. H. Kang et al.
10th International Conference on Sensing Technology (ICST), Nov 2016, Nanjing, PEOPLES R, China
Conference papers hal-01479179v1
Image document

Influence of the gate bias stress on the stability of n-type organic field-effect transistors based on dicyanovinylene-dihydroindenofluorene semiconductors

S. Bebiche , P.A. Cisneros-Perez , T. Mohammed-Brahim , M. Harnois , J. Rault-Berthelot et al.
Materials Chemistry Frontiers, 2018, 2 (9), pp.1631-1641. ⟨10.1039/c8qm00193f⟩
Journal articles hal-01881024v1

Low temperature (≦600°C) unhydrogenated in-situ doped polysilicon thin film transistors: Towards a technology for flat panel displays

L. Pichon , F. Raoult , K. Mourgues , K. Kis-Sion , T. Mohammed-Brahim et al.
Thin Solid Films, 1997, 296 (1-2), pp.133-136. ⟨10.1016/S0040-6090(96)09373-X⟩
Journal articles istex hal-03662125v1

State creation induced by gate bias stress in unhydrogenated polysilicon TFTs

B. Tala-Ighil , A. Rahal , K. Mourgues , A. Toutah , L. Pichon et al.
Thin Solid Films, 1999, 337 (1-2), pp.101-104. ⟨10.1016/S0040-6090(98)01192-4⟩
Journal articles istex hal-03662132v1

State creation under gate-bias stress in polysilicon TFTs studied from the temperature-transfer characteristics behavior

H. Toutah , Jean-François Llibre , B. Tala-Ighil , B. Boudart , T. Mohammed-Brahim et al.
Thin Solid Films, 2003, 427 (1-2), pp.340 - 344. ⟨10.1016/S0040-6090(02)01209-9⟩
Journal articles istex hal-01647833v1

Very-Low Surface Roughness in Laser Crystallized Polycrystalline Silicon

K. Mourgues , L. Pichon , F. Raoult , T. Mohammed-Brahim , D. Briand et al.
MRS Proceedings, 1997, 471, pp.197. ⟨10.1557/PROC-471-197⟩
Journal articles hal-03662122v1

Gate bias stress in hydrogenated and unhydrogenated polysilicon thin film transistors

B. Tala-Ighil , H. Toutah , A. Rahal , K. Mourgues , L. Pichon et al.
Microelectronics Reliability, 1998, 38 (6-8), pp.1149-1153. ⟨10.1016/S0026-2714(98)00098-5⟩
Journal articles istex hal-03662130v1

Effect of total gas pressure in sputtered hydrogenated amourphous silicon.

Abdelkrim Fedala , Moussa Khefiani-Guellil , S Tata , C. Simon , T. Mohammed-Brahim et al.
physica status solidi (c), 2014, C11 (11-12 )
Journal articles hal-01522411v1
Image document

Microcrystalline silicon: Strain gauge and sensor arrays on flexible substrate for the measurement of high deformations

Y. Kervran , O. de Sagazan , S. Crand , N. Coulon , T. Mohammed-Brahim et al.
Sensors and Actuators A: Physical , 2015, 236, pp.273--280. ⟨10.1016/j.sna.2015.08.001⟩
Journal articles hal-01240765v1

13.56 MHz rectifier based on a microcrystalline silicon Schottky diodes for RFID application

I. Souleiman , C. Simon , N. Coulon , S. Crand , T. Mohammed-Brahim et al.
11th IEEE Nanotechnology Materials and Devices Conference (NMDC), Oct 2016, Toulouse, France
Conference papers hal-01479174v1

Microcrystalline silicon based TFTs and resistors for reliable flexible electronics

Y. Kervran , K. Kandoussi , H. Dong , S. Janfaoui , N. Coulon et al.
Symposium on Thin Film Transistors 13, TFT 2016 - PRiME 2016/230th ECS Meeting, Oct 2016, Honolulu, United States. pp.13--25, ⟨10.1149/07510.0013ecst⟩
Conference papers hal-01397913v1

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material

H. Toutah , B. Tala-Ighil , Jean-François Llibre , B. Boudart , T. Mohammed-Brahim et al.
Microelectronics Reliability, 2003, 43 (9-11), pp.1531 - 1535. ⟨10.1016/S0026-2714(03)00271-3⟩
Journal articles istex hal-01647861v1

Silicon deformation sensors fabricated directly on flexible substrate

T. Mohammed-Brahim , Nathalie . Coulon , Claude Simon , K. Kandoussi , S. Janfaoui et al.
15st NAMIS Workshop Nano/Micro System for Health and Safety, June 26-28,2017, Organized by Korea Institue of Machinery and Materials (KIMM), , Jun 2017, Daejeon, South Korea
Conference papers hal-01758402v1

Highly resilient crystalised silicon for flexible sensors and electronic devices

T. Mohammed-Brahim , Nathalie . Coulon , C. Simon , Emmanuel Jacques , K. Kandoussi et al.
27th international conference on Amorphous and Nanocrystalline Seminconductors (ICANS27), Aug 2017, SEOUL, South Korea
Conference papers hal-01758477v1

Visible and near-infrared photo-detector combining Polysilicon TFT and PbS quantum dots Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors VI

Xiang Liu , E Jacques , Lumei Wei , T. Mohammed-Brahim
ECI - ULSIC vs TFT: 6th international Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and thin film Transistors, 2017, Hernstein, Australia
Conference papers hal-01530081v1