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authFullName_s : Remi Boidin
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X-ray photoelectron spectroscopy analysis of Ge-Sb-Se pulsed laser deposited thin films

Emeline Baudet , Christophe Cardinaud , Remi Boidin , Aurelie Girard , Jan Gutwirth et al.
Journal of the American Ceramic Society, 2018, 101 (8), pp.3347-3356. ⟨10.1111/jace.15512⟩
Journal articles hal-01833232v1