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authFullName_s : Jong Mo Lee

The Effect of Bake Temperature on SU-8 Gate Insulator of IGZO Thin Film Transistor

Min-Taek Hong , Seung Jae Moon , Jong Mo Lee , Byung Seong Bae , Eui-Jung Yun et al.
Journal of the Korean Physical Society, 2018, 73 (3), pp.297-301. ⟨10.3938/jkps.73.297⟩
Journal articles hal-01879714v1