%0 Journal Article %T Experimental validation of the surface state distribution model in the Suzuki theory to qualify the thin film surface materials %+ Institut d'Électronique et des Technologies du numéRique (IETR) %A Pichon, Laurent %A Yang, K. %A Salaün, Anne-Claire %< avec comité de lecture %@ 0038-1101 %J Solid-State Electronics %I Elsevier %V 154 %P 12-15 %8 2019-04 %D 2019 %R 10.1016/j.sse.2019.02.002 %K Field effect conductance %K Suzuki theory %K Surface state density %K Thin film transistors %K Polycrystalline silicon %Z Engineering Sciences [physics]Journal articles %G English %2 https://univ-rennes.hal.science/hal-02050589/document %2 https://univ-rennes.hal.science/hal-02050589/file/S0038110118305641.pdf %L hal-02050589 %U https://univ-rennes.hal.science/hal-02050589 %~ UNIV-NANTES %~ UNIV-RENNES1 %~ CNRS %~ INSA-RENNES %~ IETR %~ CENTRALESUPELEC %~ UR1-HAL %~ UR1-MATH-STIC %~ UR1-UFR-ISTIC %~ IETR-MM %~ TEST-UR-CSS %~ UNIV-RENNES %~ INSA-GROUPE %~ TEST-HALCNRS %~ UR1-MATH-NUM %~ ELSEVIER %~ NANTES-UNIVERSITE %~ UNIV-NANTES-AV2022