@article{hong:hal-01879714, TITLE = {{The Effect of Bake Temperature on SU-8 Gate Insulator of IGZO Thin Film Transistor}}, AUTHOR = {Hong, Min-Taek and Moon, Seung Jae and Lee, Jong Mo and Bae, Byung Seong and Yun, Eui-Jung and Harnois, Maxime and Jacques, Emmanuel and Mohammed-Brahim, Tayeb}, URL = {https://univ-rennes.hal.science/hal-01879714}, JOURNAL = {{Journal of the Korean Physical Society}}, PUBLISHER = {{Korean physical society}}, VOLUME = {73}, NUMBER = {3}, PAGES = {297-301}, YEAR = {2018}, MONTH = Aug, DOI = {10.3938/jkps.73.297}, KEYWORDS = {Oxide semiconductor ; Oxide TFT ; Low voltage driving ; Insulator ; Oxidation response}, HAL_ID = {hal-01879714}, HAL_VERSION = {v1}, }