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Article Dans Une Revue IEEE Transactions on Electromagnetic Compatibility Année : 2015

Probability of EMC Failure and Sensitivity Analysis With Regard to Uncertain Variables by Reliability Methods

Résumé

In this study, we use a statistical approach to treat a risk analysis of an EMC default. This approach relies upon reliability methods from probabilistic engineering mechanics. An estimation of a probability of failure (i.e., probability that the induced current by crosstalk causes a malfunction of a device connected at the end of a cable) and a sensitivity analysis of this probability of failure is carried out by taking into account uncertainties on input parameters. The reliability methods introduced in this study allow to compute a probability of failure with a relative low computational cost compared to Monte Carlo simulation.
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Dates et versions

hal-01116322 , version 1 (20-10-2018)

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Mourad Larbi, Philippe Besnier, Bernard Pecqueux. Probability of EMC Failure and Sensitivity Analysis With Regard to Uncertain Variables by Reliability Methods. IEEE Transactions on Electromagnetic Compatibility, 2015, 57 (2), pp.274-282. ⟨10.1109/TEMC.2014.2378912⟩. ⟨hal-01116322⟩
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