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Article Dans Une Revue Materials Science and Engineering: B Année : 2012

Thermal conductivity of InAs quantum dot stacks using AlAs strain compensating layers on InP substrate

Résumé

The growth and thermal conductivity of InAs quantum dot (QD) stacks embedded in GaInAs matrix with AlAs compensating layers deposited on (1 1 3)B InP substrate are presented. The effect of the strain compensating AlAs layer is demonstrated through Atomic Force Microscopy (AFM) and X-ray diffraction structural analysis. The thermal conductivity (2.7 W/m K at 300 K) measured by the 3ω method reveals to be clearly reduced in comparison with a bulk InGaAs layer (5 W/m K). In addition, the thermal conductivity measurements of S doped InP substrates and the SiN insulating layer used in the 3ω method in the 20-200 °C range are also presented. An empirical law is proposed for the S doped InP substrate, which slightly differs from previously presented results.
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Dates et versions

hal-00698574 , version 1 (16-05-2012)

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Salman Salman, Hervé Folliot, Julie Le Pouliquen, Nicolas Chevalier, Tony Rohel, et al.. Thermal conductivity of InAs quantum dot stacks using AlAs strain compensating layers on InP substrate. Materials Science and Engineering: B, 2012, 177 (11), pp.882-886. ⟨10.1016/j.mseb.2012.03.053⟩. ⟨hal-00698574⟩
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