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Communication Dans Un Congrès Année : 2008

Optical measurement of the phase shift introduced by a slow light medium based on coupled erbium doped fiber resonators

Résumé

Since the proposition of D.D. Smith et al. [Phys. Rev. A 69 pp. 063804, 2004], the experimental demonstration of coupled resonator induced transparency has been made using passive fiber or whispering-gallery-mode microspheres. These achievements show that it is possible to integrate delay lines using high quality resonators. The maximal group delay that it can be introduced depends mainly on the relative value of the intrinsic losses with respect to the value of the coupling between the resonators. In this paper we experimentally show that the limit given by the intrinsic losses of the resonators can be circumvented by using active resonators. Our experimental setup consists in two coupled Er3+ doped fiber resonators. Each resonator can be pumped independently. Consequently, the values of the residual losses in the two resonators can also be modified independently. We then show that the transparency of the coupled resonators can be maximized using the right pumping rate in each resonator. By inserting this device into one arm of a fiber Mac Zehnder interferometer we are able to optically measure the phase shift produced by the coupled resonators as a function of the optical frequency. The group delay can be deduced from this information. We obtain a group delay of about 60 ns for 2 meters long resonators. In conclusion, we show that Er3+ doped resonators can be used for delay line applications. The active behavior of the proposed device could avoid the intrinsic loss optimization of resonators and could be generalize to other resonator geometries.
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Dates et versions

hal-00315738 , version 1 (29-08-2008)

Identifiants

Citer

Yannick Dumeige, Thi Kim Ngan Nguyen, Laura Ghisa, Stephane Trebaol, Patrice Feron. Optical measurement of the phase shift introduced by a slow light medium based on coupled erbium doped fiber resonators. SPIE Photonics West 2008 - Optoelectronic Materials, Devices, and Applications (OPTO 2008), Jan 2008, San Jose (CA), United States. pp.690407, ⟨10.1117/12.763552⟩. ⟨hal-00315738⟩
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