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Dépôts en texte intégral
92
Mots clés
Stable isotopic tracing
Annealing
Diffusion
Nuclear resonance profiling NRP
Auger electron spectroscopy AES
Adsorbed layers
Zinc oxide
Evaluation
Passivation
3C-SiC
Adsorption Isotherms
Metal-insulator transition
13C
Atomic Layer Deposition ALD
NRP
Interface defects
17Opp
Magnetization curves
Alloy
Periodic multilayer
Adsorption
17O
Rutherford backscattering spectrometry RBS
Nanostructures
Raman spectroscopy
Magnetic semiconductors
2H
PIXE
Acoustic
Oxygen deficiency
Alloys
Oxidation
AFM
Photoluminescence
SiC
Nickel
Aluminum
Growth
Nuclear reaction analysis
Acoustic propreties of solid
18O
X-ray diffraction
Al2O3
27Ald p&α
7550Ee
XRD
Multilayer
RBS
EPR
XPS
Capillary condensation
17Op
6855Jk
Nanoparticles
Transparent conductive oxide TCO
Ion implantation
Channeling
Thin films
ALD
Pulsed laser deposition
Ion beam analysis
Thin film
Silicon carbide
Gallium oxide
Epitaxial growth
Ageing
Charge exchange
Aluminium
7550Pp
HfO2
18O resonance
Pb centers
Epitaxy
Defects
27Aldp
Measurement
Topological defects
Low energy electron diffraction LEED
ADSORPTION DESORPTION HYSTERESIS
Density functional theory
Indium oxide
Gold
Energy loss
Nitridation
Magnetic anisotropy
8140Ef
Hysteresis
Silicon
Isotopic Tracing
Topological insulators
AC susceptibility
GaMnAs
15N
Ferromagnetic resonance
27Alda
Silicon Carbide
Silica
7630Lh
Sputtering
Kossel diffraction