Frequency Chirp Characterization of Silicon Ring Resonator Modulators - Systèmes Photoniques Access content directly
Journal Articles IEEE Photonics Technology Letters Year : 2022

Frequency Chirp Characterization of Silicon Ring Resonator Modulators

Abstract

The frequency chirping properties of silicon ring resonator modulators (RRMs) are experimentally investigated under sinusoidal modulation. The modulated electric field at the output of an RRM is measured in the time domain thanks to a coherent detection system. The power and phase waveforms are then analyzed in terms of their temporal phase and amplitude for different wavelength detunings between the optical source and the resonance and for different modulation frequencies. The evolution of the frequency chirp, described through a peak-to-peak chirp parameter, is quantified as a function of wavelength detuning and modulation frequency for the first time.
Fichier principal
Vignette du fichier
Frequency_Chirp_Characterization_of_Silicon_Ring_Resonator_Modulators.pdf (781.88 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

hal-03693026 , version 1 (10-06-2022)

Identifiers

Cite

Erwan Weckenmann, Laurent Bramerie, Mathilde Gay, Diego Perez-Galacho, Frederic Boeuf, et al.. Frequency Chirp Characterization of Silicon Ring Resonator Modulators. IEEE Photonics Technology Letters, 2022, 34 (12), pp.653-656. ⟨10.1109/LPT.2022.3179650⟩. ⟨hal-03693026⟩
28 View
61 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More