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Article Dans Une Revue Ultramicroscopy Année : 1995

Study of the features of PSTM images by means of a perturbative approach

Résumé

We present a perturbative expression of the scattered near field. A comparison with a rigorous simulation using an integral method allows to determine its range of validity. The numerical results are then compared with near-field data reported by de Fornel et al. and a good qualitative agreement is observed. The perturbative expression of the scattered field provides an insight into the dependence of the near-field measurements upon the plane of incidence and the height of the tip. Finally, we show that it is possible to retrieve the exact profile from the near-field data with a subwavelength resolution.

Dates et versions

hal-01617876 , version 1 (17-10-2017)

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Anne Sentenac, Jean-Jacques Greffet. Study of the features of PSTM images by means of a perturbative approach. Ultramicroscopy, 1995, 57 (2-3), pp.246 - 250. ⟨10.1016/0304-3991(94)00147-F⟩. ⟨hal-01617876⟩
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