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Derniers dépôts
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L. Chahed, J. Frigerio, F. Jérémie, M. Thèye. Characterization of inhomogeneous weakly absorbing thin films by photothermal deflection spectroscopy, applications to hydrogenated amorphous silicon films. Journal de Physique IV Proceedings, 1994, 04 (C7), pp.C7-121-C7-124. ⟨10.1051/jp4:1994729⟩. ⟨jpa-00253257⟩